The 76th JSAP Autumn Meeting, 2015

Presentation information

Poster presentation

8 Plasma Electronics » 8 Plasma Electronics(Poster)

[15p-PB2-1~53] 8 Plasma Electronics(Poster)

Tue. Sep 15, 2015 6:30 PM - 8:30 PM PB2 (Shirotori Hall)

6:30 PM - 8:30 PM

[15p-PB2-2] Development of particle measurement system in thermal spray process

〇Yukihiko Yamagata1, Megumi Kobayashi1, Yasuyuki Kawaguchi2, Masafumi Yamasaki2, Fumihiro Miyazaki2, Katsunori Muraoka2 (1.Kyushu Univ., 2.Plazwire Co., Ltd.)

Keywords:thermal spray process,particle parameter,time of flight

Thermal spray technology, in which particle melted by discharge plasma or other heating process deposits and forms a coating layers onto material, is already used widely in the fields such as structure bodies of bridge or steel tower, the chemical plant and so on in order to improve abrasion resistance, chemical resistance and corrosion resistance. Because the characteristics of the produced film greatly depends on the temperature and the velocity of the molten particle, the development of a standard particle parameter measurement system has been strongly desired for achievement of the high performance and high quality of the film, and for the appropriate control of the process. In this study, a compact and low-cost measurement system has been developed for a plasma spray process in particular.