The 76th JSAP Autumn Meeting, 2015

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Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[16a-2D-5~12] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Wed. Sep 16, 2015 10:15 AM - 12:15 PM 2D (212-2)

座長:上野 智雄(農工大)

11:00 AM - 11:15 AM

[16a-2D-8] Research on charge-up compensation in x-ray photoelectron spectroscopy

〇YUUTA TSUBUKI1,2, Daisuke Kobayashi1,2, Kazuyuki Hirose1,2 (1.Univ. Tokyo, 2.ISAS/JAXA)

Keywords:x-ray photoelectron spectroscopy,charge-up