[16a-2U-1~12] 6.6 Probe Microscopy

[16a-2U-8] Positioning mechanism of AFM imaging for distributed nano-material

〇Hiroshi Itoh¹, Junichi Niitsuma¹ (1.AIST)

Keywords:AFM,Nano-material,Optical microscope

Atomic force microscope combined with optical microscope is developped. Near field lighting to the nanomaterial and other lighting method is developped to identify the materials, which is smaller than half of the wavelength.