Measurement the charge state of Pd clusters on alumina film by capacitance force microscopy

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Wed. Sep 16, 2015 1:30 PM - 5:00 PM 2U (233)

座長:山田豊和(千葉大),影島賢巳(関西医科大)

2:30 PM - 2:45 PM

〇tomohiro watanabe¹, yokoyama hirotaka¹, yanjun li¹, yasuhiro sugawara¹, yoshitaka naitoh¹ (1.Osaka Univ.)

Keywords:capacitance force microscopy