The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[16p-2U-1~12] 6.6 Probe Microscopy

6.6と12.2のコードシェアセッションあり

Wed. Sep 16, 2015 1:30 PM - 5:00 PM 2U (233)

座長:山田 豊和(千葉大),影島 賢巳(関西医科大)

3:00 PM - 3:15 PM

[16p-2U-6] Development of ultrahigh vacuum scanning tunneling potentiometry (UHV-STP)(III)

〇Masayuki Hamada1, Yukio Hasegawa1 (1.ISSP, the univ. of Tokyo)

Keywords:scanning tunneling potentiometry,scanning tunneling microscope

Scanning tunneling potentiometry (STP) is a method enabling us to obtain spatial distribution of electrical potential in μV resolution over a sample surface under current flow simultaneously with STM imaging. Because of technical difficulties, however, STP has seldom been applied to atomically-ordered surfaces that have to be prepared under ultrahigh vacuum.We are now developing an experimental setup for the STP measurement on such clean surfaces. In this presentation, the performance of our equipment and the results of the measurements will be reported.