Session information

Poster presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[13a-P17-1~2] 15.8 Crystal evaluation, impurities and crystal defects

Fri. Mar 13, 2015 9:30 AM - 11:30 AM P17 (Gymnasium)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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9:30 AM - 11:30 AM

[13a-P17-1] Observations of vacancy and interstitial distributions during CZ silicon growth by detaching from melt

〇Takao Abe¹, Toru Takahashi¹, Koun Shirai² (1.ShinEtsu Handotai, 2.Osaka Univ.)

9:30 AM - 11:30 AM

[13a-P17-2] Observation of strain field in Al ion-implanted silicon carbide crystals by X-ray grazing incidence topography and local rocking curve imaging

〇Yumiko Takahashi¹, Keiichi Hirano¹, Jun-ichi Yoshimura¹, Yoshiki Yamashita¹, Takayoshi Shimura², Shinji Nagamachi³ (1.KEK-PF, 2.Osaka Univ., 3.Nagamachi Science Laboratory Co., Ltd.)

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