[11a-A12-1~13] 3.12 Nanoscale optical science and near-field optics

[11a-A12-13] Tip-sample distance dependence of near-field light imaging by using force detection

〇Junsuke Yamanishi¹, Takashi Tokuyama¹, Yoshitaka Naitoh¹, Yanjun Li¹, Yasuhiro Sugawara¹ (1.Osaka Univ.)

Keywords:near-field light,atomic force microscopy,scanning probe microscopy