[11a-A14-1~13] 3.8 Optical measurement, instrumentation, and sensor

[11a-A14-3] Calculation of the refractive index for semiconductor thin film by a spectrophotometer

takayuki miyazaki¹, 〇(B)yoshinori matsubara¹, sadao adachi¹ (1.Gunma Univ.)

Keywords:spectrophotometer,refractive index,semiconductor