[11a-A27-1~13] 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

[11a-A27-12] Characterization of Electron Field Emission from Multiply-Stacking Si Quantum Dots

〇Daichi Takeuchi¹, Katsunori Makihara¹, Akio Ohta², Mitsuhisa Ikeda³, Seiichi Miyazaki¹ (1.Nagoya Univ., 2.Nagoya Univ. VBL, 3.Hiroshima Univ.)

Keywords:electron emission