The 62nd JSAP Spring Meeting, 2015

Presentation information

Oral presentation

16 Amorphous and Microcrystalline Materials » 16.1 Fundamental properties and their evaluation in disordered materials

[12a-A28-1~12] 16.1 Fundamental properties and their evaluation in disordered materials

Thu. Mar 12, 2015 9:15 AM - 12:30 PM A28 (6A-203)

10:00 AM - 10:15 AM

[12a-A28-4] Measurements of metal oxide semiconductors by ATR–FUV spectroscopy

〇Ichiro Tanabe1, Yukihiro Ozaki1 (1.Kwansei Gakuin Univ.)

Keywords:metal oxide,far-ultraviolet spectroscopy