[12a-A28-1~12] 16.1 Fundamental properties and their evaluation in disordered materials

[12a-A28-6] Evaluations of Photo-and Bias-induced stress Instability of Amorphous Oxide Semiconductor using reflection CPM and the relations with TFT instabilities

〇Hiroki Takeyama¹, Yuhki Ohno¹, Kousaku Shimizu¹ (1.Nihon Univ.)

Keywords:amorphous,semiconductor,oxide