The 62nd JSAP Spring Meeting, 2015

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[12a-D9-1~7] 6.6 Probe Microscopy

Thu. Mar 12, 2015 10:00 AM - 11:45 AM D9 (16-304)

10:30 AM - 10:45 AM

△ [12a-D9-3] The simultaneous measurement of local contact potential difference on the rutile TiO2(110) by FM-AFM/KPFM

〇Masahide Suesada1, Huanfei Wen1, Ryosuke Kanbayashi1, Yoshitaka Naitoh1, Yan Jun Li1, Yasuhiro Sugawara1 (1.Osaka Univ.)

Keywords:KPFM