Measurement of the contact potential difference of Pd atoms on Al<sub>2</sub>O<sub>3</sub>/NiAl(110) without Feedback KPFM

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Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Thu. Mar 12, 2015 10:00 AM - 11:45 AM D9 (16-304)

11:15 AM - 11:30 AM

〇Hirotaka Yokoyama¹, Tomohiro Watanabe¹, Yoshitaka Naitoh¹, Yanjun Li¹, Yasuhiro Sugawara¹ (1.Osaka Univ.)

Keywords:KPFM