The 62nd JSAP Spring Meeting, 2015

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Poster presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[12a-P7-1~4] 7.2 Applications and technologies of electron beams

Thu. Mar 12, 2015 9:30 AM - 11:30 AM P7 (Gymnasium)

9:30 AM - 11:30 AM

▲ [12a-P7-1] Measurement of interfacial potential using transport of intensity equation

〇(P)Xiaobin Zhang1, 2, Yoshifumi Oshima2, 3 (1.Tokyo Institute of Technology, 2.JST-CREST, 3.JAIST)

Keywords:phase map,transport of intensity equation (TIE),transmission electron microscopy (TEM)