The 62nd JSAP Spring Meeting, 2015

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7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[12p-A11-1~21] 7.2 Applications and technologies of electron beams

Thu. Mar 12, 2015 1:30 PM - 7:00 PM A11 (6A-116)

3:45 PM - 4:00 PM

[12p-A11-10] Improvement of the signal-to-noise ratio of images obtained by annular bright-field phase STEM

〇(D)Takafumi Ishida1, Tadahiro Kawasaki2, 3, 4, Takayoshi Tanji2, 4, Takashi Ikuta5 (1.Nagoya Univ., 2.Nagoya Univ. EcoTopia Sci. Inst., 3.JFCC, 4.GREEN, 5.Osaka electro-comm. Univ.)

Keywords:phase reconstruction