The 62nd JSAP Spring Meeting, 2015

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[12p-A11-1~21] 7.2 Applications and technologies of electron beams

Thu. Mar 12, 2015 1:30 PM - 7:00 PM A11 (6A-116)

3:15 PM - 3:30 PM

[12p-A11-8] The high spatial resolution field visualization by low energy electron beam deflection method

〇Konomi Yoshida1, 2, Yuki Aihara1, 2, Katsuhisa Murakami1, 2, Junichi Fujita1, 2 (1.Institute of applied physics, Univ. Tsukuba, 2.Tsukuba Research Center for Interdisciplinary Materials Science)

Keywords:electron microscopy,local field,electron deflection