The 62nd JSAP Spring Meeting, 2015

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9 Applied Materials Science » 9.2 Nanowires and Nanoparticles

[12p-A20-1~16] 9.2 Nanowires and Nanoparticles

Thu. Mar 12, 2015 2:00 PM - 6:30 PM A20 (6A-212)

4:15 PM - 4:30 PM

▲ [12p-A20-9] Atomic Characterization of Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography

〇(DC)Bin Han1, Yasuo Shimizu1, Koji Inoue1, Gabriele Seguini2, Michele Perego2, Yasuyoshi Nagai1 (1.IMR Tohoku Univ., 2.IMM-CNR)

Keywords:Atom probe tomography,Si nanocrystal