The 62nd JSAP Spring Meeting, 2015

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Symposium » Valence-electron metamorphology in oxide semiconductors

[12p-D1-1~12] Valence-electron metamorphology in oxide semiconductors

Thu. Mar 12, 2015 1:15 PM - 6:30 PM D1 (16-101)

4:30 PM - 4:45 PM

[12p-D1-8] Drain current stress durability of crystalline OS-FETs

〇HARUYUKI BABA1, AKIO SUZUKI1, YOSHIYUKI KOBAYASHI1, SHINPEI MATSUDA1, SATORU SAITO2, MASAHIKO HAYAKAWA2, SHUNPEI YAMAZAKI1, 2 (1.SEL, 2.AFD Inc.)

Keywords:oxide semiconductor,thin film transistor,IGZO