The 62nd JSAP Spring Meeting, 2015

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Poster presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[12p-P8-1~14] 13.2 Exploratory Materials, Physical Properties, Devices

Thu. Mar 12, 2015 1:30 PM - 3:30 PM P8 (Gymnasium)

1:30 PM - 3:30 PM

[12p-P8-12] Characterization of surface on BiVO4 thin films

〇Yuto Kubo1, Shin-Ichi Yamamoto1, Mikihiko Nishitani2 (1.Ryukoku Univ., 2.Osaka Univ.)

Keywords:BiVO4,Photon Yield Spectroscopy,Surface