The 62nd JSAP Spring Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[13a-A25-1~13] 13.2 Exploratory Materials, Physical Properties, Devices

Fri. Mar 13, 2015 9:00 AM - 12:30 PM A25 (6A-218)

10:00 AM - 10:15 AM

[13a-A25-5] Cross-sectional TEM observation of Ni-Mg2Si interface prepared by SPS method (2)

〇Hiroharu Sugawara1, Yuki Yamazaki1, Shin'ichi Nakamura2, Shigeyuki Nakamura3, Yoshihisa Mori4, Ken'ichi Takarabe4 (1.Tokyo Metro. U., 2.Aoyama Gakuin U., 3.Tsuyama Coll. Tech., 4.Okayama U. Sci.)

Keywords:magnesium silicide,TEM,spark plasma sintering