[13a-P18-1~22] 合同セッションＫ ワイドギャップ酸化物半導体材料・デバイス（ポスター）

▲ [13a-P18-5] Physical Property Evaluation of ZnO Thin Film Fabricated by Low-temperature process for Flexible Transparent Devices

〇(M2)Hiraku Watanabe¹, Adie Bin Mohd Khafe¹, Hiroshi Yamuchi¹, Shigekazu Kuniyoshi¹, Masatoshi Sakai¹, Masaaki Iizuka², Kazuhiro Kudo¹ (1.Grad. Sch. Chiba. Univ., 2.Chiba Univ.)

キーワード：wet-processed ZnO,Crystalline evaluation,low-process temperature