[13p-C2-1~11] Growth and characterization of bulk crystalline silicon for photovoltaic application

△ [13p-C2-8] Micro-PL imaging: potential of as a characterization method of multicrystalline silicon wafers

〇Shunya Ninomiya¹, Kentaro kutsukake^{1, 2}, Momoko Deura¹, Yutaka Ohno¹, Noritaka Usami³, Ichiro Yonenaga¹ (1.Tohoku Univ., 2.JST PRESTO, 3.Nagoya Univ.)

Keywords:PL,dislocation,grain-boundary