4:30 PM - 4:45 PM
△ [13p-C2-8] Micro-PL imaging: potential of as a characterization method of multicrystalline silicon wafers
Keywords:PL,dislocation,grain-boundary
Symposium
Symposium » Growth and characterization of bulk crystalline silicon for photovoltaic application
Fri. Mar 13, 2015 1:15 PM - 6:15 PM C2 (6C-207)
4:30 PM - 4:45 PM
Keywords:PL,dislocation,grain-boundary