The 62nd JSAP Spring Meeting, 2015

Presentation information

Symposium

Symposium » Growth and characterization of bulk crystalline silicon for photovoltaic application

[13p-C2-1~11] Growth and characterization of bulk crystalline silicon for photovoltaic application

Fri. Mar 13, 2015 1:15 PM - 6:15 PM C2 (6C-207)

4:30 PM - 4:45 PM

[13p-C2-8] Micro-PL imaging: potential of as a characterization method of multicrystalline silicon wafers

〇Shunya Ninomiya1, Kentaro kutsukake1, 2, Momoko Deura1, Yutaka Ohno1, Noritaka Usami3, Ichiro Yonenaga1 (1.Tohoku Univ., 2.JST PRESTO, 3.Nagoya Univ.)

Keywords:PL,dislocation,grain-boundary