The 62nd JSAP Spring Meeting, 2015

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[13p-D9-1~11] 6.6 Probe Microscopy

Fri. Mar 13, 2015 4:30 PM - 7:30 PM D9 (16-304)

5:30 PM - 5:45 PM

[13p-D9-5] Discrimination between NH2 and H on an NH3-reacted Si(111)-(7x7) surface by non-contact atomic force microscopy/force spectroscopy

〇Yuki Sakano1, Ryo Inamura1, Masahiko Tomitori2, Toyoko Arai1 (1.Kanazawa Univ., 2.JAIST)

Keywords:AFM,Si(111),force spectroscopy