The 62nd JSAP Spring Meeting, 2015

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[13p-D9-1~11] 6.6 Probe Microscopy

Fri. Mar 13, 2015 4:30 PM - 7:30 PM D9 (16-304)

6:00 PM - 6:15 PM

[13p-D9-6] Effect of H-terminated Si film on a Si tip for energy dissipation with nc-AFM

〇Ryo Inamura1, Sakano Yuki1, Tomitori Masahiko2, Arai Toyoko1 (1.Kanazawa Univ., 2.JAIST)

Keywords:AFM