The 62nd JSAP Spring Meeting, 2015

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Poster presentation

6 Thin Films and Surfaces » 6.5 Surface Physics, Vacuum

[13p-P7-1~12] 6.5 Surface Physics, Vacuum

Fri. Mar 13, 2015 4:30 PM - 6:30 PM P7 (Gymnasium)

4:30 PM - 6:30 PM

△ [13p-P7-12] Stabilization of Quantitative Analysis for XPS by using Dynamic Shirley Method

〇(B)Ryo Matsumoto1, Hiromi Tanaka1, Hideki Yoshikawa2, Shigeo Tanuma2, Kazuhiro Yoshihara3 (1.Yonago National College of Tech., 2.NIMS, 3.Omicron NanoTechnology Japan)

Keywords:X-ray Photoelectron Spectroscopy,Quantitative Analysis,Dynamic Shirley Method