[13p-P8-1~5] 7.4 Buried interface sciences with quantum beam

[13p-P8-2] Charge Neutralization using Electron and Ion Beams in HAXPES Measurement

〇Masahiko Yoshiki¹, Shizuka Hosoi², Hideki Okado³, Masayuki Inaba⁴, Yugo Kubo⁵, Toshihiko Hayashi⁶, Shinichi Noguchi⁷, Noritake Isomura⁸, Tomoaki Kawamura⁹, Masafumi Matsumoto¹⁰, Kazumi Kurooka¹¹, Kazuhiro Ueda¹², Kenji Nomura¹³, Akira Kiyoi¹⁴, Shintaro Umemoto¹⁵ (1.Toshiba Corp., 2.Sony Corp., 3.Kawasaki Heavy Ind. Ltd., 4.Kobe Steel Ltd., 5.Sumitomo Electric Ind. Ltd., 6.Kansai Electric Power Co. Inc., 7.Central Research Inst. of Electric Power Ind., 8.Toyota Central R&D Labs., 9.Nichia Corp., 10.Nissan Motor Co. Ltd., 11.Panasonic Corp., 12.Hitachi Ltd., 13.Fujitsu Lab. Ltd., 14.Mitsubishi Electric Corp., 15.SPring-8 Service Co. Ltd.)

Keywords:Photoelectron Spectroscopy,Synchrotron Radiation,Charge Neutralization