4:30 PM - 6:30 PM
[13p-P8-4] X-ray Reflectivity Study on Multilayer Film Structure with Delta Layer
Keywords:X-ray Reflectivity,Thin-film standard material,Thickness
Poster presentation
7 Beam Technology and Nanofabrication » 7.4 Buried interface sciences with quantum beam
Fri. Mar 13, 2015 4:30 PM - 6:30 PM P8 (Gymnasium)
4:30 PM - 6:30 PM
Keywords:X-ray Reflectivity,Thin-film standard material,Thickness