The 62nd JSAP Spring Meeting, 2015

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Oral presentation

2 Ionizing Radiation » 2.2 Detection systems

[14a-A19-1~12] 2.2 Detection systems

Sat. Mar 14, 2015 9:00 AM - 12:15 PM A19 (6A-211)

11:30 AM - 11:45 AM

[14a-A19-10] Evaluation of the Defect Levels in 4H-SiC Schottky Barrier Diodes by Heavy Ion Microbeam

〇(M1C)Yuya Kanbayashi1, 2, Yushi Ando1, Wataru Kada1, Onoda Shinobu2, Takahiro Makino2, Norihiro Hoshino3, Hidekazu Tsuchida3, Osamu Hanaizumi1, Tomihiro Kamiya2, Takeshi Ohshima2 (1.Gunma Univ., 2.JAEA, 3.CRIEPI)

Keywords:QTS,DLTS,SiC