The 62nd JSAP Spring Meeting, 2015

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6 Thin Films and Surfaces » 6.3 Oxide electronics

[14a-D10-1~9] 6.3 Oxide electronics

Sat. Mar 14, 2015 9:30 AM - 11:45 AM D10 (16-305)

11:00 AM - 11:15 AM

[14a-D10-7] Analysis for memory operation region of ReRAM using electron beam absorbed current (EBAC) method

〇Hisashi SHIMA1, Hiroyuki AKINAGA1 (1.NeRI, AIST)

Keywords:ReRAM,Oxide