[14a-D14-1~11] 12.2 Characterization and Materials Physics

[14a-D14-8] A new method to determine deep trapping lifetime in organic semiconductor devices using impedance spectroscopy

〇Kenichiro Takagi¹, Takashi Nagase^{1, 2}, Takashi Kobayashi^{1, 2}, Hiroyoshi Naito^{1, 2} (1.Osaka Pref. Univ., 2.RIMED)

Keywords:impedance spectroscopy,carrier lifetime,organic semiconductor