The 62nd JSAP Spring Meeting, 2015

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[14a-D9-1~11] 6.6 Probe Microscopy

Sat. Mar 14, 2015 9:00 AM - 12:00 PM D9 (16-304)

11:30 AM - 11:45 AM

[14a-D9-10] A noise reduction of detection circuit used stray capacitance compensation circuit for NC-AFM

Hiroaki Ooe1, 〇Mikihiro Fujii1, Toyoko Arai1 (1.Kanazawa Univ.)

Keywords:NC-AFM,Si(111)