The 62nd JSAP Spring Meeting, 2015

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[14a-D9-1~11] 6.6 Probe Microscopy

Sat. Mar 14, 2015 9:00 AM - 12:00 PM D9 (16-304)

10:45 AM - 11:00 AM

[14a-D9-7] Selective measurement of spontaneous polarization induced potentials by scanning nonlinear dielectric potentiometry

〇Kohei Yamasue1, Yasuo Cho1 (1.Tohoku University)

Keywords:scanning nonlinear dielectric microscopy,scanning nonlinear dielectric potentiometry,spontaneous polarization