Simultaneous measurements of the charge and current amplifier outputs in NC-AFM

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Sat. Mar 14, 2015 9:00 AM - 12:00 PM D9 (16-304)

11:00 AM - 11:15 AM

〇Makoto Nogami¹, Toyoko Arai², Akira Sasahara¹, Masahiko Tomitori¹ (1.JAIST, 2.Kanazawa Univ.)

Keywords:charge amplifier,contact potential difference,capacitance