[14p-A20-1~7] 9.3 Nanoelectronics

[14p-A20-1] Investigation of Electrical Properties of Nanogap-Based Single-Electron Transistors Using Field-Emission-Induced Electromigration

〇Masashi Kase¹, Kohei Morihara¹, Kazutaka Okada¹, Jun-ichi Shirakashi¹ (1.Tokyo Univ. Agr. & Tech.)

Keywords:nanogap,electromigration,single-electron transistor