The 62nd JSAP Spring Meeting, 2015

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6 Thin Films and Surfaces » 6.3 Oxide electronics

[14p-D10-1~7] 6.3 Oxide electronics

Sat. Mar 14, 2015 1:00 PM - 2:45 PM D10 (16-305)

2:00 PM - 2:15 PM

△ [14p-D10-5] Analysis of filament property using a planar ReRAM

〇(M1)Yusuke Sawai1, Sang-Gyu Koh1, Tomohiro Aoki1, Satoru Kisida1, 2, Kentaro Kinoshita1, 2 (1.Tottori Univ., 2.Tottori Univ. Integrated Frontier Research Center)

Keywords:ReRAM,planar,four-terminal measurement