Temperature dependence of conductance in NiO-based ReRAM after semi-forming process

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

Sat. Mar 14, 2015 1:00 PM - 2:45 PM D10 (16-305)

2:15 PM - 2:30 PM

〇Hiroki Sasakura¹, Yusuke Nishi¹, Tsunenobu Kimoto¹ (1.Kyoto Univ.)

Keywords:Resistive switching memory,nickel oxide,quantum point contact