The 62nd JSAP Spring Meeting, 2015

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[14p-D9-1~8] 6.6 Probe Microscopy

Sat. Mar 14, 2015 1:00 PM - 3:00 PM D9 (16-304)

1:30 PM - 1:45 PM

[14p-D9-3] Thickness Estimation of Layered Structure at Ionic Liquid/Solid Interfaces Using Force Curve Measurements Based on Simultaneous Acquisitions of Frequency Shift and Deflection Signals

〇Yasuyuki Yokota1, Noriki Osaka1, Akihito Imanishi1, Ken-ichi Fukui1 (1.Osaka Univ.)

Keywords:Frequency modulation AFM,Ionic liquid