Ryota Suewaka

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Speaker, Author, Co-Author

Fri. Sep 16, 2016 9:30 AM - 11:30 AM P6 (Exhibition Hall)

Poster presentation
| 15 Crystal Engineering
| 15.8 Crystal evaluation, impurities and crystal defects

[16a-P6-1~9] 15.8 Crystal evaluation, impurities and crystal defects

9:30 AM - 11:30 AM

[16a-P6-2] Effect of thermal history on grown-in defect behavior during single crystal Si growth

〇Ryota Suewaka¹, Toshiaki Saishoji¹, Kazuhiro Harada¹ (1.SUMCO CORPORATION)