Hao Qiu

Speaker, Author, Co-Author

Wed. Sep 14, 2016 9:00 AM - 12:15 PM B13 (Exhibition Hall)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices and related technologies

[14a-B13-1~10] 13.5 Semiconductor devices and related technologies

11:30 AM - 11:45 AM

▲ [14a-B13-8] A New Write Stability Metric for Yield Estimation in SRAM Cells at Low Supply Voltage

〇(D)Hao Qiu¹, Kiyoshi Takeuchi¹, Tomoko Mizutani¹, Takuya Saraya¹, Masaharu Kobayashi¹, Toshiro Hiramoto¹ (1.Institute of Industrial Science, The University of Tokyo)

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