3:15 PM - 3:45 PM
[13p-A31-5] History and Current Situation of Atomic Resolution Atomic Force Microscopy
Keywords:AFM
AFM has passed 30 years since the invention in 1985. In the meantime, the mechanical properties evaluation function to measure the local force curve, horizontal and vertical exchange type atom manipulation / assembly function, and semiconductor elements identification function due to the force curve measurement was achieved even at room temperature. In this talk, we introduce the history and current situation of such atomic resolution AFM.