Absolute calibration of a soft x-ray grazing incidence spectrometer for highly charged ion plasma observation

Thanh Hung Dinh; Yoshiki Kondo; Toshiki Tamura; Goki Arai; Tetsuya Makimura; Shigeru Ohta; Ken Kitano; Yoichi Yamamoto; Masahiko Ishino; Masaharu Nishikino; Takeo Ejima; Tadashi Hatano; Takeshi Higashiguchi

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[13p-C31-1~11] 7.1 X-ray technologies

Tue. Sep 13, 2016 1:45 PM - 5:00 PM C31 (Nikko Kujaku AB)

Takeshi Higashiguchi(Utsunomiya Univ.), Atsushi Sunahara(Inst. for Laser Tech.)

2:30 PM - 2:45 PM

[13p-C31-4] Absolute calibration of a soft x-ray grazing incidence spectrometer for highly charged ion plasma observation

〇(P)Thanh Hung Dinh^1,4, Yoshiki Kondo¹, Toshiki Tamura¹, Goki Arai¹, Tetsuya Makimura², Shigeru Ohta³, Ken Kitano³, Yoichi Yamamoto⁴, Masahiko Ishino⁴, Masaharu Nishikino⁴, Takeo Ejima⁵, Tadashi Hatano⁵, Takeshi Higashiguchi¹ (1.Utsunomiya Univ., 2.Univ. of Tsukuba, 3.VOI, 4.KPSI-QST, 5.IMRAM, Tohoku Univ.)

Keywords:EUV optical devices, Laser-produced plasma