Control of Tunnel Resistance by Inducing Migration of Au Atoms Using Field-Emission-Induced Electromigration

Presentation information

Oral presentation

9 Applied Materials Science » 9.3 Nanoelectronics

Tue. Sep 13, 2016 1:30 PM - 4:00 PM C42 (Nikko Hakuhou)

1:30 PM - 1:45 PM

〇Tomoyuiki Ito¹, Kazuki Inoue¹, Yusuke Kihara¹, Kazutaka Okada¹, Takanari Saito¹, Jun-ichi Shirakashi¹ (1.Tokyo Univ. Agr. & Tech.)

Keywords:Au Nanogap, Ni Nanogap, Electromigration