[13p-P3-1~1] 7.4 Buried interface sciences with quantum beam

△ [13p-P3-1] X-ray Structural Analysis of Vertically Grown Structures of Silica Precursor on Micro-phase Separated Monolayer Templates

〇Masumi Eda¹, Eri Nasuno¹, Norihiro Kato¹, Ken-ichi Iimura¹ (1.Utsunomiya Univ.)

Keywords:spread monolayer, fine structure, X-ray diffractometry

Vertically grown structures (VGS) of silica precursor were fabricated on template surfaces prepared from micro-phase separated Langmuir monolayers. Structural analysis with in-plane and/or out-of-plane X-ray diffractometries was made for the monolayers and VGS. Three template surfaces with different two-dimensional morphologies were prepared from different combinations of film molecules in the mixed monolayers, and were used for site-selective growth of VGS. The change of monolayer morphologies and the formation mechanism of VGS were considered based on molecular packing structures obtained through the X-ray experiments.