9:15 AM - 9:30 AM
[14a-A24-2] PID test for c-Si photovoltaic modules under irradiation
Keywords:PID, irradiation
Potential-induced degradation (PID) test was carried out for crystalline Si photovoltaic modules under light irradiation in order to clarify the influence of irradiation on the PID. It was found that the PID is suppressed by irradiation and the suppression effect is not dependent on the intensity but on the wavelength. No persistent effect was also suggested.