The 77th JSAP Autumn Meeting, 2016

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[14a-A32-1~7] 6.6 Probe Microscopy

Wed. Sep 14, 2016 9:30 AM - 11:15 AM A32 (302B)

Toyokazu Yamada(Chiba Univ.)

9:30 AM - 9:45 AM

[14a-A32-1] [Young Scientist Presentation Award Speech] Role of valence states in inelastic tunneling spectroscopy of NO on Cu surfaces

Akitoshi Shiotari1,2, Hitoshi Okuyama1, Shinichiro Hatta1, Tetsuya Aruga1, Maite Alducin3,4, Thomas Frederiksen3,5 (1.Kyoto Univ., 2.Univ. of Tokyo, 3.DIPC, 4.CFM/MPC, 5.IKERBASQUE)

Keywords:scanning tunneling microscopy, inelastic electron tunneling spectroscopy, scanning tunneling spectroscopy

Inelastic electron tunneling spectroscopy (IETS) is a powerful tool for chemical characterization with a scanning tunneling microscope (STM). Recently theoretical studies have established "propensity rules," whereas the experimental insight still remains insufficient.
We studied NO molecules on Cu(110) and Cu(001) surfaces with STM, IETS, and scanning tunneling spectroscopy (STS) at 6 K. We investigated a correlation between IETS signals and resonance states of isolated NO molecules. We also conducted density functional theory (DFT) calculations which successfully reproduce the experimental results. On the basis of "propensity rules" the IETS signals can be explained in a quantitative manner.