2016年 第77回応用物理学会秋季学術講演会

講演情報

一般セッション(口頭講演)

4 JSAP-OSA Joint Symposia 2016 » 4.1 Plasmonics

[14a-C302-1~10] 4.1 Plasmonics

2016年9月14日(水) 09:00 〜 12:15 C302 (日航30階鳳凰)

Verma Prabhat(阪大)、久保 若奈(農工大)

12:00 〜 12:15

[14a-C302-10] Fabrication of Plasmonic Spectral Filter for Visible Light Communication

〇(M1)Tatsuya Nakashio1、Megumi Shiraishi1、Yasushi Oshikane1、Motohiro Nakano1、Claire Heck2、Shoichi Mochizuki2、Kensuke Murai2 (1.Osaka Univ.、2.AIST Kansai)

キーワード:plasmonics, visible light communication, MIM structure

Visible light communication by white LED lights would be useful for communication and environmental sensing. A plasmonic spectral filter based on a metal-insulator-metal (MIM) structure can be used for this purpose. Considering that absorption dips are numerically predicted for this MIM structures even with normal incidence and that change in the absorption dip is expected if either the refractive index or the thickness of the insulator layer changes, this structure could be used as a photonic device for environmental sensing as well as for visible light communication.
In order to fabricate a plasmonic spectral filter, we have developed several prototypes of the MIM structure on glass substrates by conventional vacuum deposition method and established the importance of monitoring the thickness of the insulator layer for the MI structure. However, the PLZT, which exhibits electro-optic effect as an insulator, requires a perovskite crystalline phase, which is achieved under the annealing temperature of 700oC in air. Under this temperature, the first silver layer (M1) aggregates on the glass substrate, and the MIM structure needs to be protected with capping and seeding layers. In order to fabricate the designed filtering wavelength, we employed in situ monitoring of the absorption dip for the MI structure.
We have successfully monitored the absorption dip during the coating of the insulator layer and have demonstrated the relationship between the filtering wavelength for the MIM structure and the dip wavelength for the MI structure.