[14p-A24-1~11] Present status and future prospects on reliability of photovoltaic modules

[14p-A24-11] Damp heat testing of CIGS modules with forward bias:a new option for the proposed IEC61215-1-4 draft

〇Keiichiro Sakurai¹, Kinichi Ogawa¹, Hajime Shibata¹, Atsushi Masuda¹, Hiroshi Tomita², Darshan Schmitz², Shuuji Tokuda² (1.AIST, 2.Solar Frontier)

Keywords:CIGS, Damp Heat test, forward bias voltage

We have found that conventional damp-heat (DH) test on a commercial CIGS module causes an irreversible "Test-Specific" degradation (TSD) that is not observed in modules deployed in fields. To avoid this TSD, we have proposed an test option to apply bias voltage during the damp heat testing of CIGS modules, so that the voltage inside the module becomes closer to real field conditions. This option is to be incorporated in the draft of IEC61215-1-4.