The 77th JSAP Autumn Meeting, 2016

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[14p-A32-1~16] 6.6 Probe Microscopy

Wed. Sep 14, 2016 1:15 PM - 5:30 PM A32 (302B)

Akira Sasahara(Kobe Univ.), Shu Kurokawa(Kyoto Univ.)

2:15 PM - 2:30 PM

[14p-A32-5] Characterization of Al nano-cluster by Non-Contact AFM

〇(M1)Hiroki Miyazaki1, Jo Onoda1, Yoshiaki Sugimoto1 (1.Univ. of Tokyo)

Keywords:Atomic Force Microscopy