[14p-B2-1~19] 3.9 Terahertz technologies

[14p-B2-4] Development of THz Magneto-optical Ellipsometry with 4x4 Matrix Analysis

〇Takeshi Nagashima¹, Kohei Tachi², Tsutomu Araki² (1.Setsunan Univ., 2.Ritsumeikan Univ.)

Keywords:magneto-optical effect, ellipsometry, terahertz

We developed THz time domain magneto-optical spectroscopic ellipsometry with 4x4 matrix analysis method. In 4x4 matrix method, polarized complex reflectivities of a sample with layered structure under a magnetic field are described by a product of matrices that express responses of layers to THz wave. Densities, scattering times and effective masses of the free carriers in the sample are evaluated by using the developed scheme. The results on an undoped InAs wafer and 2DEG in an AlGaAs/GaAs heterostructure will be shown.